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Before & After Market (BAM) Blog: Authenticity Versus Reliability

Posted By George Karalias on Jun 25, 2014

Rochester recently participated in another guest post featured on Military Embedded Systems’ website which addresses a misconception in the semiconductor world that authenticity is synonymous with reliability. Among the proposed solutions to determine authenticity of a component are tagging and imaging each one. However, when a tagged component completes a life-cycle and ends up in [...]