Why reducing IC component test costs can be an expensive practice

Is cutting IC component testing costs a good practice?

IC Component Testing

 This practice of reducing test costs is often referred to as “test optimization” and can also include a practice known as “worst-case” testing, a method in which only the determined worst-case conditions are measured for common parameters.

These cost reduction methods can be detrimental to the quality levels of IC devices and may also lead to shipment of “maverick” lots, lots with a higher than average chance of failure because they usually exhibit operating parameters which are no longer typical, but still within data book specifications.



Learn More - The Quality of Test